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      Raster-Elektronenmikroskopie 

      Elementanalyse und Abbildung mit emittierten Quanten und Augerelektronen

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      Springer Berlin Heidelberg

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          Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides

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            XCIII.On the theory of X-ray absorption and of the continuous X-ray spectrum

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              Auger electron spectroscopy

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                Book Chapter
                1977
                : 186-222
                10.1007/978-3-642-81112-8_6
                d3ae99e6-6dc2-4d96-b561-027c015aecea
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