Record: found
Abstract: not found
Book Chapter: not found

Auflösungsgrenze, Gesichtsfeld und Schärfentiefe

other

Author(s): G. Schimmel

Publication date (Print): 1969

Publisher: Springer Berlin Heidelberg

Read this book at

Publisher

Buy book

Bookmark

There is no author summary for this book yet. Authors can add summaries to their books on ScienceOpen to make them more accessible to a non-specialist audience.

Related collections

Most cited references 4

Record: found
Abstract: not found
Book: not found

Elektronenmikroskopische Untersuchungs- und Präparationsmethoden

Ludwig Reimer (1967)

0 comments Cited 29 times – based on 0 reviews

Bookmark

Record: found
Abstract: not found
Article: not found

High resolution scanning electron microscopy

R. Pease, W C Nixon (1965)

0 comments Cited 20 times – based on 0 reviews      Review now

Bookmark

Record: found
Abstract: not found
Article: not found

Notizen: Elektronenmikroskopische Untersuchungen an dünnen Kohlefolien

F. Thon (1965)

0 comments Cited 8 times – based on 0 reviews      Review now

Bookmark

All references

Author and book information

Book Chapter

Publication date (Print): 1969

Pages: 86-106

DOI: 10.1007/978-3-642-92986-1_5

SO-VID: adc4c04f-17fe-4d82-a718-c1b360ed41f3

History

Data availability:

Auflösungsgrenze, Gesichtsfeld und Schärfentiefe

Read this book at

Related collections

Hogrefe Pflege

Most cited references 4

Elektronenmikroskopische Untersuchungs- und Präparationsmethoden

High resolution scanning electron microscopy

Notizen: Elektronenmikroskopische Untersuchungen an dünnen Kohlefolien

Author and book information

Book Chapter

History

Comments

Comment on this book

Book chapters

Similar content 915