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Raster-Elektronenmikroskopie
Elementanalyse und Abbildung mit emittierten Quanten und Augerelektronen
other
Author(s):
Ludwig Reimer
,
Gerhard Pfefferkorn
Publication date
(Print):
1977
Publisher:
Springer Berlin Heidelberg
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Hogrefe Psychology
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Empirical Correction Factors for the Electron Microanalysis of Silicates and Oxides
A. E. Bence
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A. Albee
(1968)
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XCIII.On the theory of X-ray absorption and of the continuous X-ray spectrum
H. A. Kramers
(1923)
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Auger electron spectroscopy
Chuan Chang
(1971)
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Author and book information
Book Chapter
Publication date (Print):
1977
Pages
: 186-222
DOI:
10.1007/978-3-642-81112-8_6
SO-VID:
d3ae99e6-6dc2-4d96-b561-027c015aecea
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Book chapters
pp. 1
Einleitung
pp. 16
Wechselwirkung Elektron-Materie
pp. 60
Elektronenoptik, Aufbau und Funktion des Raster-Elektronenmikroskopes
pp. 109
Abbildung mit Sekundär-, Rückstreuelektronen und Probenströmen
pp. 168
Raster-Transmissions-Elektronenmikroskopie
pp. 186
Elementanalyse und Abbildung mit emittierten Quanten und Augerelektronen
pp. 223
Auswertemethoden rasterelektronenmikroskopischer Aufnahmen
pp. 237
Präparation
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