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Handbook of Microscopy for Nanotechnology
other
Editor(s):
Nan Yao
,
Zhong Lin Wang
Publication date
(Print):
2005
Publisher:
Kluwer Academic Publishers
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There is no author summary for this book yet. Authors can add summaries to their books on ScienceOpen to make them more accessible to a non-specialist audience.
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Atomic Force Microscopy
Author and book information
Book
ISBN (Print):
1-4020-8003-4
Publication date (Print):
2005
DOI:
10.1007/1-4020-8006-9
SO-VID:
f4d932a5-9783-4991-8016-05e975923d34
License:
http://www.springer.com/tdm
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Book chapters
pp. 3
Confocal Scanning Optical Microscopy and Nanotechnology
pp. 25
Scanning Near-Field Optical Microscopy in Nanosciences
pp. 55
Scanning Tunneling Microscopy
pp. 113
Visualization of Nanostructures with Atomic Force Microscopy
pp. 157
Scanning Probe Microscopy for Nanoscale Manipulation and Patterning
pp. 183
Scanning Thermal and Thermoelectric Microscopy
pp. 207
Imaging Secondary Ion Mass Spectrometry
pp. 227
Atom Probe Tomography
pp. 247
Focused Ion Beam System—a Multifunctional Tool for Nanotechnology
pp. 287
Electron Beam Lithography
pp. 325
High-Resolution Scanning Electron Microscopy
pp. 361
High Spatial Resolution Quantitative Electron Beam Microanalysis for Nanoscale Materials
pp. 401
Characterization of Nano-Crystalline Materials Using Electron Backscatter Diffraction in the Scanning Electron Microscope
pp. 427
High Resolution Transmission Electron Microscopy
pp. 455
Scanning Transmission Electron Microscopy
pp. 493
In-Situ Electron Microscopy for Nanomeasurements
pp. 531
Environmental Transmission Electron Microscopy in Nanotechnology
pp. 567
Electron Nanocrystallography
pp. 601
Tomography Using the Transmission Electron Microscope
pp. 629
Off-Axis Electron Holography
pp. 653
SUB-NM Spatially Resolved Electron Energy-Loss Spectroscopy
pp. 683
Imaging Magnetic Structures Using TEM
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