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Metallurgical Process Technology and Chemical Process Analytics

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Author(s): Karl Heinz Koch

Publication date (Print): 1999

Publisher: Springer Berlin Heidelberg

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Most cited references 56

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Sputtered neutral mass spectrometry (SNMS) as a tool for chemical surface analysis and depth profiling

E. Stumpe, H Oechsner (1977)

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Trends in surface and interface analysis

M Grasserbauer, G Friedbacher, H Hutter … (1993)

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Analytical chemistry

M Otto, M OTTO, R Kellner … (1998)

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Publication date (Print): 1999

Pages: 101-168

DOI: 10.1007/978-3-662-03772-0_6

SO-VID: b9ddb75a-0546-4ece-b5c5-7d37fbdc25bc

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Metallurgical Process Technology and Chemical Process Analytics

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Tsinghua Science and Technology

Most cited references 56

Sputtered neutral mass spectrometry (SNMS) as a tool for chemical surface analysis and depth profiling

Trends in surface and interface analysis

Analytical chemistry

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