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Die physikalische Wirkungsweise von Kristallverstärkern (Transistoren)
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Author(s):
Eberhard Spenke
Publication date
(Print):
1965
Publisher:
Springer Berlin Heidelberg
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Carrier Generation and Recombination in P-N Junctions and P-N Junction Characteristics
William Shockley
,
Chih-Tang Sah
,
Robert Noyce
(1957)
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The Theory ofp-nJunctions in Semiconductors andp-nJunction Transistors
W. Shockley
(1949)
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A Unipolar "Field-Effect" Transistor
W. Shockley
(1952)
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Book Chapter
Publication date (Print):
1965
Pages
: 184-235
DOI:
10.1007/978-3-642-48244-1_5
SO-VID:
6913f40b-861e-4a77-acf4-47aa3b701f38
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Book chapters
pp. 1
Der Leitungsmechanismus in elektronischen Halbleitern
pp. 31
Störstellen und Versetzungen
pp. 94
Das Defektelektron
pp. 111
Die Wirkungsweise von Kristallgleichrichtern
pp. 184
Die physikalische Wirkungsweise von Kristallverstärkern (Transistoren)
pp. 236
Näherungsmethoden in der Quantenmechanik des Wasserstoffmoleküls
pp. 247
Das Bändermodell
pp. 391
Fermi-Statistik der Kristallelektronen
pp. 459
Rekombinationsmechanismen in elektronischen Halbleitern
pp. 501
Randschichten in Halbleitern und der Kontakt Halbleiter-Metall
pp. 548
Der einfachste Fall einer quantenmechanischen Theorie der Beweglichkeit
pp. 588
Mathematischer Anhang
pp. 653
Erratum to: Störstellen und Versetzungen
pp. 653
Erratum
pp. 653
Erratum to: Randschichten in Halbleitern und der Kontakt Halbleiter-Metall
pp. 653
Erratum to: Fermi-Statistik der Kristallelektronen
pp. 653
Erratum to: Rekombinationsmechanismen in elektronischen Halbleitern
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