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Microelectronic Materials and Processes
Properties and Applications of Silicides
other
Author(s):
S. P. Murarka
Publication date
(Print):
1989
Publisher:
Springer Netherlands
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Electrical-Resistivity Model for Polycrystalline Films: the Case of Arbitrary Reflection at External Surfaces
A. F. Mayadas
,
M. Shatzkes
(1970)
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FUNDAMENTAL TRANSITION IN THE ELECTRONIC NATURE OF SOLIDS
T. McGill
,
C. A. Mead
,
S. Kurtin
(1969)
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Refractory silicides for integrated circuits
S. P. Murarka
(1980)
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Author and book information
Book Chapter
Publication date (Print):
1989
Pages
: 275-323
DOI:
10.1007/978-94-009-0917-5_7
SO-VID:
24875bb9-7771-4990-a6d7-932581770850
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Book chapters
pp. 1
Silicon Crystal Growth
pp. 25
Silicon Epitaxy
pp. 79
Silicon Oxidation
pp. 133
Physical Vapor Deposition
pp. 203
Chemical Vapor Deposition
pp. 247
Dielectric Materials
pp. 275
Properties and Applications of Silicides
pp. 325
Forefront of Photolithographic Materials
pp. 409
Fine-Line Lithography
pp. 459
Dry Etching Processes
pp. 521
Ion Implantation
pp. 583
Diffusion in Semiconductors
pp. 635
Interconnect Materials
pp. 679
Imperfection and Impurity Phenomena
pp. 775
Process Simulation
pp. 845
Diagnostic Techniques
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