The high frame rate of new detectors based on CMOS technology allows fast acquisition of large 4DSTEM datasets. We have developed a software called EMplified Scan for 4DSTEM acquisition with the TVIPS TemCam-XF416ES, the DECTRIS hybrid cameras QUADRO and the ultra-fast ARINA detector. Synchronization between image acquisition and scanning is controlled by the TVIPS Universal Scan Generator. The datasets are stored for postprocessing in HDF5 format with metadata for camera and microscope parameters.
EMplified Scan is able to calculate virtual detectors in real-time during the acquisition of 4DSTEM datasets. Therefore, several custom virtual detectors can be shown together with standard STEM detectors in a continuous mode. It supports microscope control like automatic beam blanking and detector insertion and retraction.
A hybrid detector like the DECTRIS ARINA allows large scans in very short time. For example a 1024 × 1024 scan with the 2× binned pixel (96 × 96 pixel, pixel size 200×200µm) takes less than 10 sec. With 4k x 4k pixel, the TemCam-XF415ES offers a larger resolution and a higher field of view. The framerate is depending on the readout area of the sensor. A 512 × 512 pixel scan at a camera size of 256 × 256 pixel takes less than 6 min. For diffraction mapping application it is possible to scan, e.g. 100 × 100 scan points with an image field of 1024 × 1024 pixel in less than a minute.
Smart Citations