The Application of Advanced Electron Microscope on the Frontier Materials

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The Application of Advanced Electron Microscope on the Frontier Materials

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Author(s): Jiangtao Qu ¹ ^, , Julie M. Cairney ²

Publication date (Electronic): 21 January 2025

Conference name: 13th Asia Pacific Microscopy Congress 2025 (APMC13)

Conference date: 2-7 Febuary 2025

Keywords: TEM, APT, FIB

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Publication date (Electronic): 21 January 2025

Electronic Location Identifier: e340

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[1 ]Sydney Microscopy and Microanalysis, The University of Sydney, Sydney, NSW, Australia

[2 ]School of Aerospace, Mechanical and Mechatronic Engineering, University of Sydney, Camperdown, NSW 2006, Australia

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*Corresponding author: jiangtao.qu@ 123456sydney.edu.au

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Jiangtao Qu https://orcid.org/0000-0003-0357-4205

Julie M. Cairney https://orcid.org/0000-0003-4564-2675

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DOI: 10.14293/APMC13-2025-0340

SO-VID: 078b48e8-7bc1-4df7-98a8-1780ba150299

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Published under Creative Commons Attribution 4.0 International ( CC BY 4.0). Users are allowed to share (copy and redistribute the material in any medium or format) and adapt (remix, transform, and build upon the material for any purpose, even commercially), as long as the authors and the publisher are explicitly identified and properly acknowledged as the original source.

Conference name: 13th Asia Pacific Microscopy Congress 2025

Conference acronym: APMC13

Conference number: 13

Conference location: Brisbane, Australia

Conference date: 2-7 Febuary 2025

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References

Williams, David B., and C. Barry Carter. Transmission Electron Microscopy: A Textbook for Materials Science. 2nd ed. New York: Springer, https://link.springer.com/book/10.1007/978-0-387-76501-3.
Gault, Baptiste, Michael P. Moody, Julie M. Cairney, and Simon P. Ringer. Atom Probe Microscopy. Vol. 160. Springer Series in Materials Science. New York, NY: Springer, 2012, https://doi.org/10.1007/978-1-4614-3436-8.
Giannuzzi, L.A., and F.A. Stevie, Micron 30, 1999, pp. 197–204. https://doi.org/10.1016/S0968-4328(99)00005-0.
Miller, Michael K., Kaye F. Russell, Keith Thompson, Roger Alvis, and David J. Larson. Microscopy and Microanalysis 13, 2007, pp. 428–36. https://doi.org/10.1017/S1431927607070845.

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[1] Williams, David B., and C. Barry Carter. Transmission Electron Microscopy: A Textbook for Materials Science. 2nd ed. New York: Springer, https://link.springer.com/book/10.1007/978-0-387-76501-3.

[2] Gault, Baptiste, Michael P. Moody, Julie M. Cairney, and Simon P. Ringer. Atom Probe Microscopy. Vol. 160. Springer Series in Materials Science. New York, NY: Springer, 2012, https://doi.org/10.1007/978-1-4614-3436-8.

[3] Giannuzzi, L.A., and F.A. Stevie, Micron 30, 1999, pp. 197–204. https://doi.org/10.1016/S0968-4328(99)00005-0.

[4] Miller, Michael K., Kaye F. Russell, Keith Thompson, Roger Alvis, and David J. Larson. Microscopy and Microanalysis 13, 2007, pp. 428–36. https://doi.org/10.1017/S1431927607070845.

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