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      • Record: found
      • Abstract: found
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      Is Open Access

      Microanalysis, X-ray Mapping and AMICS Analysis of REE Concentrates

      Published
      conference-abstract
      Author(s): 1 , , 2 , 2 , 2 , 3 , 4 , 2
      Publication date (Electronic):
      Conference name: 13th Asia Pacific Microscopy Congress 2025 (APMC13)
      Conference date: 2-7 Febuary 2025
      Keywords: AMICS, automated mineralogy, XRD, Microanalysis, X-ray Mapping
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            Abstract

            Content

            Author and article information

            Conference
            Publication date (Electronic): 21 January 2025
            Electronic Location Identifier: e286
            Affiliations
            [1 ]NewSpec Pty Ltd, 330 Glen Osmond Rd, Myrtle Bank, SA, Australia
            [2 ]Western Sydney University, Advanced Materials Characterisation Facility (AMCF)
            [3 ]Moran Scientific Pty Ltd, 4850 Oallen Ford Road, Bungonia, NSW, 2580, Australia
            [4 ]University of Adelaide, Adelaide Microscopy
            Author notes
            *Corresponding author: tim.murphy@ 123456newspec.com.au
            Article
            DOI: 10.14293/APMC13-2025-0286
            SO-VID: 69676931-d1fa-47ab-a3bb-d90fa18e740e
            Copyright © 2025 The Authors.
            License:

            Published under Creative Commons Attribution 4.0 International ( CC BY 4.0). Users are allowed to share (copy and redistribute the material in any medium or format) and adapt (remix, transform, and build upon the material for any purpose, even commercially), as long as the authors and the publisher are explicitly identified and properly acknowledged as the original source.

            Conference name: 13th Asia Pacific Microscopy Congress 2025
            Conference acronym: APMC13
            Conference number: 13
            Conference location: Brisbane, Australia
            Conference date: 2-7 Febuary 2025
            History
            Categories
            Subject: ID03 - Application of Microanalysis

            Keywords: XRD,X-ray Mapping,Microanalysis,automated mineralogy,AMICS

            References

            1. R. Wuhrer, K. Moran and L. Moran, “Characterisation of Materials through X-ray Mapping”, Materials Forum, Volume 30, (2006) 63–70.

            2. K. Moran and R. Wuhrer, “Quantitative Bulk and Trace Element X-Ray Mapping Using Multiple Detectors”, Mikrochimica Acta, Vol. 155, pp. 59–66 (2006).

            3. Chi Li, “AMICS Automated Materials Characterization ready for the challenges of tomorrow” M&M 2024 AMICS workshop presentation (2024).

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