Biomaterials research frequently involves biomimetic materials that are soft, non-conductive or beam sensitive in nature. When imaging such beam-sensitive or soft materials, it is often necessary to employ low accelerating voltages to prevent material damage or excessive charging effect. However, reducing accelerating voltages or beam currents typically results in poor image quality and low resolution. On the other hand, while surface coating reduces the charging effect of non-conductive materials, it covers the surface feature of the sample and result in the loss of surface details.
One key advantage of low kV imaging is its capability to perform imaging without the detrimental effects associated with high-energy electrons. This is particularly important for beam sensitive materials, where even minimal exposure to a high-energy beam can alter or destroy the delicate architecture of the sample. By employing low kV settings, researchers can reduce beam damage, allowing for a more accurate representation of the native state of the material.
In our studies, we utilized low to ultra-low accelerating voltages to investigate various biomaterials or beam sensitive materials, which include hydrogels, polymeric cell membranes, and biopolymers. Using the scanning electron microscopy (SEM) at kV levels between 0.05 to 1 kV, we achieved remarkable results that highlight the structural nuances of these samples. For instance, the preservation of surface morphology and internal microstructure was enabled without conductive surface coatings.
The technology that we have adopted in this study is the GEMINI technology where it was developed to gain good resolution at low voltages. This is achieved by using in-column beam deceleration, without immersing the sample in strong electric or magnetic fields.
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