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      Sensitivity analysis of the electrostatic interaction between the atomic force microscopy probe and a thin dielectric film with 3D-localized charge cloud

      1 , 2 , 1 , 2 , 1 , 1 , 2 , 2
      Journal of Applied Physics
      AIP Publishing

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          Atomic Force Microscope

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            Kelvin probe force microscopy and its application

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              Contact electrification using force microscopy

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                Author and article information

                Journal
                Journal of Applied Physics
                Journal of Applied Physics
                AIP Publishing
                0021-8979
                1089-7550
                January 28 2019
                January 28 2019
                : 125
                : 4
                : 045305
                Affiliations
                [1 ]LAPLACE, University of Toulouse, CNRS, INPT, UPS, 118 route de Narbonne, F-31062 Toulouse, France
                [2 ]ICA (Clement Ader Institute), Paul Sabatier University, 3 Rue Caroline Aigle, F-31400 Toulouse, France
                Article
                10.1063/1.5060655
                c5a943b6-ec3b-4c6c-ad1e-1763b557222b
                © 2019
                History

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