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      The Role of Texture On The Reliability Of Aluminum Based Interconnects

      MRS Proceedings
      Cambridge University Press (CUP)

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          Most cited references32

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          Measurement and Interpretation of stress in aluminum-based metallization as a function of thermal history

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            Electromigration Damage in Aluminum Film Conductors

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              A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer

              L. Schulz (1949)
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                Author and article information

                Journal
                applab
                MRS Proceedings
                MRS Proc.
                Cambridge University Press (CUP)
                1946-4274
                January 1993
                February 21 2011
                January 1993
                : 309
                Article
                10.1557/PROC-309-75
                bc7a8e01-dec3-4a7a-bf08-d30f3bc96182
                © 1993
                History

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