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      Memristor-based PUF for lightweight cryptographic randomness

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          Abstract

          Physical unclonable functions (PUF) are cryptographic primitives employed to generate true and intrinsic randomness which is critical for cryptographic and secure applications. Thus, the PUF output (response) has properties that can be utilized in building a true random number generator (TRNG) for security applications. The most popular PUF architectures are transistor-based and they focus on exploiting the uncontrollable process variations in conventional CMOS fabrication technology. Recent development in emerging technology such as memristor-based models provides an opportunity to achieve a robust and lightweight PUF architecture. Memristor-based PUF has proven to be more resilient to attacks such as hardware reverse engineering attacks. In this paper, we design a lightweight and low-cost memristor PUF and verify it against cryptographic randomness tests achieving a unique, reliable, irreversible random sequence output. The current research demonstrates the architecture of a low-cost, high endurance Cu/HfO \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$_2/p^{++}$$\end{document}

          \begin{document}$$_2/p^{++}$$\end{document}
          Si memristor-based PUF (MR-PUF) which is compatible with advanced CMOS technologies. This paper explores the 15 NIST cryptographic randomness tests that have been applied to our Cu/HfO \documentclass[12pt]{minimal} \usepackage{amsmath} \usepackage{wasysym} \usepackage{amsfonts} \usepackage{amssymb} \usepackage{amsbsy} \usepackage{mathrsfs} \usepackage{upgreek} \setlength{\oddsidemargin}{-69pt} \begin{document}$$_2/p^{++}$$\end{document}
          \begin{document}$$_2/p^{++}$$\end{document}
          Si MR-PUF. Moreover, security properties such as uniformity, uniqueness, and repeatability of our MR-PUF have been tested in this paper and validated. Additionally, this paper explores the applicability of our MR-PUF on block ciphers to improve the randomness achieved within the encryption process. Our MR-PUF has been used on block ciphers to construct a TRNG cipher block that successfully passed the NIST tests. Additionally, this paper investigated MR-PUF within a new authenticated key exchange and mutual authentication protocol between the head-end system (HES) and smart meters (SM)s in an advanced metering infrastructure (AMI) for smartgrids. The authenticated key exchange protocol utilized within the AMI was verified in this paper to meet the essential security when it comes to randomness by successfully passing the NIST tests without a post-processing algorithm.

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          Most cited references24

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          Physical one-way functions.

          Modern cryptographic practice rests on the use of one-way functions, which are easy to evaluate but difficult to invert. Unfortunately, commonly used one-way functions are either based on unproven conjectures or have known vulnerabilities. We show that instead of relying on number theory, the mesoscopic physics of coherent transport through a disordered medium can be used to allocate and authenticate unique identifiers by physically reducing the medium's microstructure to a fixed-length string of binary digits. These physical one-way functions are inexpensive to fabricate, prohibitively difficult to duplicate, admit no compact mathematical representation, and are intrinsically tamper-resistant. We provide an authentication protocol based on the enormous address space that is a principal characteristic of physical one-way functions.
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            Quantum random number generators

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              Current Rectification in a Structure: ReSe 2 /Au Contacts on Both Sides of ReSe 2

              Schottky effect of two-dimensional materials is important for nanoscale electrics. A ReSe2 flake is transferred to be suspended between an Au sink and an Au nanofilm. This device is initially designed to measure the transport properties of the ReSe2 flake. However, a rectification behavior is observed in the experiment from 273 to 340 K. The rectification coefficient is about 10. The microstructure and elements composition are systematically analyzed. The ReSe2 flake and the Au film are found to be in contact with the Si substrate from the scanning electron microscope image in slant view of 45°. The ReSe2/Si and Si/Au contacts are p-n heterojunction and Schottky contacts. Asymmetry of both contacts results in the rectification behavior. The prediction based on the thermionic emission theory agrees well with experimental data.
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                Author and article information

                Contributors
                hi474@nyu.edu
                Journal
                Sci Rep
                Sci Rep
                Scientific Reports
                Nature Publishing Group UK (London )
                2045-2322
                23 May 2022
                23 May 2022
                2022
                : 12
                : 8633
                Affiliations
                [1 ]GRID grid.440573.1, ISNI 0000 0004 1755 5934, Center for Cyber Security, , New York University Abu Dhabi, ; Abu Dhabi, UAE
                [2 ]GRID grid.440568.b, ISNI 0000 0004 1762 9729, System on Chip Center and Electrical Engineering and Computer Science, , Khalifa University, ; Abu Dhabi, UAE
                Article
                11240
                10.1038/s41598-022-11240-6
                9126908
                35606367
                534fb1e0-6172-429d-8240-271505875418
                © The Author(s) 2022

                Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/.

                History
                : 3 July 2021
                : 31 March 2022
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                © The Author(s) 2022

                Uncategorized
                electrical and electronic engineering,computer science
                Uncategorized
                electrical and electronic engineering, computer science

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