BerkMin: A fast and robust SAT-solver

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Conference

Pages: 142-149

Article

DOI: 10.1109/DATE.2002.998262

SO-VID: 27f32e57-99e1-4ea5-9169-dd247c4fc523

Conference name: 2002 Design, Automation and Test in Europe Conference and Exhibition

Conference acronym: DATE-02

Conference location: Paris, France

Conference date: 4-8 March 2002

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