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      Anwendung elektronenmikroskopischer Feinbereichsbeugung zur Ermittlung der Walztextur von Kupfer

      , ,
      physica status solidi (b)
      Wiley

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          A Direct Method of Determining Preferred Orientation of a Flat Reflection Sample Using a Geiger Counter X-Ray Spectrometer

          L. Schulz (1949)
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            Texturen metallischer Werkstoffe

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              Preferred Orientation Determination Using a Geiger Counter X‐Ray Diffraction Goniometer

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                Author and article information

                Journal
                physica status solidi (b)
                phys. stat. sol. (b)
                Wiley
                03701972
                15213951
                1964
                1964
                : 7
                : 2
                : 701-710
                Article
                10.1002/pssb.19640070227
                1e3f299a-6f50-4f86-89f2-fc521cb48aeb
                © 1964

                http://doi.wiley.com/10.1002/tdm_license_1.1

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